SIL Determination And Verification
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COURSE DATES AND LOCATIONS
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INTRODUCTION
This two day SIL Verification Course is intended to provide the fundamental knowledge and understanding required to undertake a SIL Verification study in
Performing a Random Hardware Failures Assessment (commonly referred to as SIL Verification) on a Safety Instrumented Function (SIF) is a key requirement specified in international standards IEC 61508 and IEC 61511. This requirement ensures that that the SIF meets the required target failure measure in terms of Probability of Failure on Demand (PFD) or Probability of Failure per hour (PFH) as identified in the SIL Determination study.
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COURSE OBJECTIVES
By the end of the course, you‘ll be able to:
- The concept of Random Hardware Failures Assessment in the context of the requirements of IEC 61508 and IEC 61511
- The concept of a Safety Instrumented Function with respect to its functionality and its performance
- Safety Integrity and Safety Integrity Level (SIL)
- The concept of failure rate and diagnostics
- Criticality of defining Failure modes
- Modes of operation and associated Target Failures Measures
- The concept of Probability of Failure on Demand (PFD) and Probability of Failure (PFH) when assessing random hardware failures
- The concept of Hardware Fault Tolerance (HFT) and Safe Failure Fraction (SFF) when assessing Architectural Constraints
- Reliability modelling techniques using Reliability Block Diagrams (RBDs) and Fault Tree Analysis (FTA)
- Accounting for Common Cause Failures when assessing sub-systems with redundancy
- Criticality of choosing appropriate Failure Rate Data
- Impact of proof testing and partial stoke testing on the failure measure
- Use and application of the software package ProSet’s SIL Comp Module to carry out reliability modelling
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COURSE AUDIENCE
This course is made for:
- Any professionals working directly or indirectly in their workplace with functional safety and SIL when designing and/or building Safety Instrumented Systems.
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COURSE OUTLINE
Day One
- Terms and concepts
- Requirements for SIL verification
- Reliability metrics
- SIL determination
- SIS components and their failures
- Diagnostics
Day Two
- Common cause failures
- Systematic failures
- SIS architectures
- Test interval
Day Three
- Failure rates
- Simplified equations
- Sources and use of failure rate data
- Failure modes, effects and diagnostic analysis
Day Four
- Fault tree analysis
- Markov modeling
Day Five
- Uncertainty, sensitivity and correlation analysis
- SIL verification
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